TechnologyTT Correspondent | 14 Jun 2019
Anritsu Company introduces a 43.5 GHz frequency option for its 2- and 4-port ShockLine™ MS46122B, MS46322B, MS46522B, and MS46524B vector network analyzers (VNAs) with guaranteed specifications using Anritsu’s Extended-KTM type connectors and components. The ShockLine family becomes the first VNA to support specified 43.5 GHz functionality in a K-connector environment, creating distinct cost-of-test and time-to-market advantages in high-frequency applications, including 5G, satellite, and signal integrity.
With the introduction of the Extended-K calibration kits and accessories, the option eliminates the need to use inconvenient adaptors or completely change the connector type. It provides design and manufacturing engineers with an efficient solution that adds the critical 3.5 GHz to a test environment for verification of products used in emerging applications.
Anritsu leveraged its design and characterization capabilities to extend the K-connector frequency performance. The additional 3.5 GHz of guaranteed coverage enables customers to remain in the K-connector environment rather than transition to more expensive and less robust 2.4 mm connectors, saving cost and increasing compatibility across test environments.
ShockLine VNAs Combine Price and Performance
The ShockLine MS46122B, MS46322B, and MS46522B are 2-port VNAs that provide a range of price and performance in three distinct configurations to meet the needs of a wide variety of applications. The MS46122B USB VNAs are packaged in a compact 1U chassis and are externally controlled via USB from a user-supplied PC. The MS46322B is designed in a self-contained, compact, and rugged 2U chassis that includes the power supply and computer. The MS46522BPerformance ShockLine VNA delivers unprecedented value and performance in numerous test applications up to 92 GHz.
For 4-port test environments, there is the ShockLine MS46524B series. The VNAs deliver economical and performance efficiencies in a multiport VNA to lower the cost-of-test and speed time-to-market.